NEMINTEM · In-situ NanoElectrical Measurements in a Transmission Electron Microscope

Nanocharacterization techniques are becoming increasingly important. They help us to determine local atomic arrangements, element compositions as well as electronic structures. High-Resolution Transmission Electron Microscopy (HRTEM) is the most powerful and widely accepted technique. However, until recently in-situ HRTEM did not show sufficient resolution to image changes on the atomic scale. In the last five years, my group has pioneered advanced specimen holders towards in-situ HRTEM. We have leading expertise in obtaining the high resolution in a range of controllable environments: temperatures, pressures, and liquids. In addition, combinations with other types of parallel measurements were pioneered, such as in-situ low-noise electrical characterization. Clearly it is indeed possible to operate the HRTEM as a nanolaboratory. It allows to really see what one is measuring. With this proposal I want to realize the equipment and methodology to perform nano-electrical measurements of nanostructures in-situ in a HRTEM. The NanoElectrical Measurements in a Transmission Electron Microscope (NEMinTEM) will be applied to nanostructures of a range of materials. Furthermore the electron beam will be used to make well-controlled modifications of the nanostructure. The effects of these modifications on the electrical properties will be measured simultaneously. Semiconductor nanowires, graphene, metallic bridges and nanoelectrodes, and oxide multilayers will be studied, providing challenging examples with possible high-impact results It is to be expected that once NEMinTEM is mature, it will be applied to many more materials.