NANOIMAGE · Ultra-sensitive Nanoscale Potential Imaging

The invention of new microscopy tools keeps transforming many areas of major economic importance. One example is the semiconductor industry, where sophisticated imaging tools are crucial for maintaining profitable high-volume manufacturing. State of the art tools are routinely used to characterize the dimensions and electrical functionality of manufactured devices, however, as device dimensions continue to reduce there is a perpetual need for the invention of new probing tools that could cope with the new challenges.The goal of this proposal is to make a Proof of Concept (POC) for a new type of nano detector and imaging apparatus, which addresses the future performance challenges for microscopy tools in the semiconductor, solar cell and novel materials industries. The nano detector is a spinoff from a unique nano-assembly technology developed in our ERC Starters project, capable of making the most advanced carbon-nanotube-based electronic devices to date.Based on this new nano detector we intend to demonstrate an imaging apparatus that enables ultra-sensitive imaging of electrical potentials on the nanoscale. The technology is foreseen to improve the current state of the art by orders of magnitudes. We will demonstrate detectors that operate at room temperature, work at high frequencies, are fast, accurate and inexpensive to manufacture - all desirable characteristics for rapid market adoption. In addition to the technological POC, the project comprises innovation protection tasks, the delivery of a relevant business model and networking actions for successful commercialization.The novel detectors would make a vast impact on an important productive sector in Europe. They will contribute especially to yield learning - necessary for maintaining the industry profit margins and competitiveness. The detectors also answer to the current nanoscale imaging challenges in most Key Enabling Technology fields in Europe.